Scan barcode
255 pages • missing pub info (editions)
ISBN/UID: 9781461372318
Format: Paperback
Language: English
Publisher: Springer
Publication date: 09 November 2012
Description
Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in i...
Community Reviews
Content Warnings
255 pages • missing pub info (editions)
ISBN/UID: 9781461372318
Format: Paperback
Language: English
Publisher: Springer
Publication date: 09 November 2012
Description
Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in i...